On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction

I n this paper we use data collected from benchmark circuit simulations to examine the relationship between the tests which detect stuck-at faults and those which detect bridging surrogates. W e show that the coeficent of correlation between these tests approaches zero as the stuck-at fault coverage approaches 100%. A n enhanced version of the MPG-D model, which is based upon the number of detections of each site in a logic circuit, is shown to be superior to stuck-at fault coverage-based defective part level prediction. W e then compare the accuracy of both predictors for an industrial circuit tested using two different test